Gaining A Competitive Advantage by Leveraging Xcerra Test Cell Integration

Xcerra to deliver a fully integrated and validated test cell for pressure sensor test

Xcerra provide a complete test cell to a major IDM in the automotive semiconductor market. The complete test cell solution includes the tester, handler, tester interface and the sensor test module from Xcerra, and a pressure supply unit from a third party. In addition to the hardware, Xcerra will develop the test program and provide full integration and validation services.

The Xcerra test cell will combine the high-throughput capability of the Multitest InMEMS/InCarrier solution with the cost-efficient LTX-Credence Diamondx tester. The solution will also include the integration of a third party pressure supply unit. With this Xcerra solution the customer will receive a fully integrated and validated test cell for pressure sensor calibration, trim and test, providing fast time-to-volume and optimal OEE and yield.

Andreas Nagy, Senior Director, Test Cell Innovation, comments, “With the fully integrated and validated Xcerra Test Cell the customer will benefit from high operational efficiency and an accelerated time to high volume production on day one. The high throughput solution will be able to contact 90 devices in parallel resulting in a significant cost of test advantage.”

To learn more about the Xcerra Test Cell Innovation, please visit



The post Gaining A Competitive Advantage by Leveraging Xcerra Test Cell Integration appeared first on

Multitest Introduces mmWave Contactor

Revolutionary interface for high frequency testing in high volume production

Multitest successfully introduced an innovative contacting solution for testing of extremely high frequency semiconductors in high volume production. The Multitest mmWave Contactor offers field proven outstanding electrical performance while maintaining best mechanical characteristics.

Multitest has developed a revolutionary hybrid contacting solution that combines traditional spring probe architecture for low frequency and power I/O’s while incorporating a cantilever solution for the peripheral high frequency transceiver I/O’s. By combining spring probe and cantilever technologies Multitest has extended the reach of volume production contactors to the extremely high frequencies ranges needed by automotive radar, WiGig, and 5G backhaul devices.

Keeping the interface from test equipment to the device as short as possible while minimizing the number of transitions is how Multitest is able to minimize the loss and maintain broadband performance from DC to 81GHz (<-10dB return loss and 4dB to 6dB insertion loss typical at 81GHz).

The mmWave contactor addresses the mechanical requirements of high volume production by incorporating high compliance, robust spring probes and materials and onsite replacement compatibility. The contactor assembly can be fully serviced onsite without incurring delays due to shipping lead times or RMA queues. The entire contacting solution is mechanically assembled and each component can be removed and replaced on site.

The mmWave contactor solution from Xcerra is a field proven solution for high volume semiconductor test that has overcome the challenge of using of metal transmission lines for extremely high frequency applications..

Jason Mroczkowski, Director RF Product Development and Marketing explains: “With the advent of production volumes of extremely high frequency semiconductors, it begs the question, ‘How will you test it?’. The experts at Multitest have considered all factors ranging from impedance discontinuities to stackup tolerances and their impact on RF performance at mmWave frequencies. Xcerra is the only supplier offering a complete test cell solution for volume production of automotive radar devices up to 81GHz. This test cell includes the tester, handler, and interface components required for a true high volume production test of mmWave devices. A critical component of this hardware is the Multitest mmWave Contactor. To date there are many lab and low volume solutions for extremely high frequency semiconductor test, but none exist for true high volume production test of mmWave devices. Until now.”

To learn more about the Multitest mmWave Contactor family, please visit



The post Multitest Introduces mmWave Contactor appeared first on

Multitest Expands Contactor Portfolio for WLP / WLCSP Testing:

Mercury 030 combines best mechanical and electrical performance with ease of use and cost advantages  Multitest’s Mercury 030 probe meets the increasing demand for cost-efficient high performance WLP / WLCSP contacting solutions. The Mercury 030 is designed to address the electrical requirements of today’s test challenges, without sacrificing mechanical performance in an automated test environment. The Mercury 030 is a WLCSP fine pitch probe made using a Multitest proprietary process that produces a long life, high strength probe with gold plating. For high reliability, stability, and very low contact resistance contacting, the Mercury 030 has two flat surfaces moving in surface-to-surface contact. While electrical and cost benefits are turning WLP and WLCSP into the “go-to” packaging of choice, traditional wafer probe technology can prevent customers from testing the device in a WLP package to published specification. The low RLC parasitics of the Mercury 030 make it a preferred contacting solution for customers who want to fully test wafer level packaged devices in the DC, functional, and AC parametric domains. The Mercury 030 probe geometry and components provide high bandpass (8 GHz @-1 dB insertion loss) and low resistance (160 mΩ). The Mercury 030 ensures required probing coplanarity matching the vertical heights of the customers’ WLCSP balls and/or lands. With a 0.33 mm window of compliance and low insertion force, the Mercury 030 is well qualified for both singulated and multisite WLP and WLCSP contacting and/or probing. During customer field tests, the Mercury 030 demonstrated long run times between cleaning with an average probe replacement life of 300K -500K device contacts. Particularly valued in a high volume environment, the Mercury 030 is easy to setup and to maintain. Bert Brost, Product Manager at Xcerra’s Interface Product Group explains: “Although the Mercury 030 can cost less than traditional probe technology, its ease of use, ease of maintenance, and high performance attributes directly address customer test requirements. With this new contacting solution we are supporting our customers’ efforts to reduce costs and improve throughput. The Mercury 030 is the result of Multitest spring probe development experience, integrating proven technology that is of greater value to the customer than products offered by the competition.” To learn more about the Multitest Mercury family, please visit   The post Multitest Expands Contactor Portfolio for WLP / WLCSP Testing: appeared first on