http://multitest.com/wp-content/uploads/2017/05/Multitest_logo-300x70PX.png 0 0 Daniela http://multitest.com/wp-content/uploads/2017/05/Multitest_logo-300x70PX.png Daniela2016-12-19 09:17:502016-12-19 15:52:52Better Contacting Yield by Innovative Proprietary Design
Link HB Contactor Compensates for HIB tolerance Multitest launches a new design of the well-established Link contactor. The Link HB adds boardside compliance to compensate for board fabrication tolerances ensuring increased contact reliability and multisite stability. The offset vertical architecture of the Link probe is designed to support superior test yield, maximum repeatability and low repair and replacement cost. The wipe motion of the probe provides scrub through oxides on the IC pads and cleans itself when moving back to its original free height. This motion is fully decoupled from the connection to the test interface board resulting in a stable connection between the probe and the load board pad, avoiding pad wear and carbon debris buildup. This implementation also eliminates the potential for arching between the probe and the test interface board pad. Striving for continuous improvements to ensure best performance Multitest has developed a solution, which adds boardside compliance with improved pin/pad concentrated contact. This proprietary design of the Link HB (patent pending) compensates for load board planarity tolerances, which are particularly critical in multisite application. To learn more about the Multitest Link Contactor family, visit http://multitest.com/link The post Better Contacting Yield by Innovative Proprietary Design appeared first on xcerra.com.