Expanding Capabilities for Temperature Testing

Multitest Soak Booster for Significant Reduction of Soaking Time

Multitest recently installed the well-established tri-temp handler MT9928 with an enhanced Soak Booster option. The Soak Booster cuts down the soak time by up to 50%. Multitest is currently the only company offering this kind of advanced technology for gravity handlers.

With this development Multitest is responding to the market need for temperature testing of large devices where soak time closely correlates with throughput,  and as a result, impacts the cost of test. High-volume production test of automotive devices is one market that benefits from this enhanced Soak Booster capability.

Whereas the industry standard for gravity handling is thermal heat transfer by radiation from track to device, Soak Booster uses convection as transfer principle. The temperature controlled air is blown directly to the device.

The “Soak Booster” option is built on Multitest’s excellence in temperature test solutions and is available for SO packages down to 300 mil in size.

To learn more about the MT9928 gravity handler, please visit http://multitest.com/mt9928

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Proven RF Performance Based on Proprietary Design

Link HB Contactor Compensates for HIB Tolerances

Multitest’s Link HB contactor exhibited excellent RF performance at customer sites ensuring ultra-clean high speed signals. The patent-pending design adds boardside compliance to compensate for board fabrication tolerances ensuring increased contact reliability and multisite stability.

Based on the well-established offset vertical architecture of the Link contactor, Multitest has developed the Link HB which adds boardside compliance with improved pin/pad concentrated contact. The proprietary design of the Link HB (patent pending) compensates for load board planarity tolerances, which are particularly critical in multisite applications.

The offset vertical architecture of the Link contactor family is designed to support superior test yield, maximum repeatability and low repair and replacement cost. The wipe motion of the probe provides scrub through oxides on the IC pads and cleans itself when moving back to its original free height.

This motion is fully decoupled from the connection to the test interface board resulting in a stable connection between the probe and the load board pad, avoiding pad wear and carbon debris buildup. This implementation also eliminates the potential for arcing between the probe and the test interface board pad.

Tony Tiengtum, Product Manager, commented, “Two recent European customers have confirmed the superior performance of the Link HB contactor.  In feedback to us they said the actual performance of the contactor was as advertised and went on to say that the Link contactor technology made it seem like the sockets were essentially transparent from an electrical perspective.”

To learn more about the Multitest Link Contactor family, please visit http://multitest.com/link

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