High Parallel Test for Singulated Packages
> strip-like device carrier for single device
> no singulated after test
> combines the advantages of the singulated device test with the advantages of strip test
Multitest InCarrier® is a strip-like device carrier for single devices that combines the advantages of the singulated device test process with the advantages of high parallel strip test.
The InCarrier® material flow at the test floor remains over all similar to the established standard process. Unlike to strip test, the InCarrier® test requires no singulation after test. Therefore the final test remains true final test. This way it overcomes the boundaries of strip test and meets the automotive 6 sigma - 0 PPM requirements.
Leveraging the strip like design the InCarrier® ensures robust test-handling for even smallest devices and supports high parallel test.
The InCarrier® supports all major applications such as:
- automotive and power devices
- RF and communication
- logic, analog and microcontrollers