Multitest Test in Carriers
> strip-like device carrier for single device
> no singulated after test
> combines the advantages of the singulated device test with the advantages of strip test
Multitest InCarrier® process is based on a strip-like device carrier for single devices that combines the advantages of the singulated device test with the advantages of high parallel strip test.
The InCarrier® material flow at the test floor remains over all similar to the established standard process. Unlike to strip test, the InCarrier® test requires no singulation after test. Therefore the final test remains true final test. This way it overcomes the boundaries of strip test and meets the automotive 6 sigma - 0 PPM requirements.
Leveraging the strip like design the InCarrier® ensures robust test-handling for even smallest devices and supports high parallel test.
The InCarrier® loading supports all standard transportation media of the backend process:
- JEDEC tray
- wafer ring