matches existing spring pin test boards for an easy and cost-efficient conversion
extended operating range
contact motion decoupled from the test board
proven self-cleaning wipe
durable one piece design
low and stable contact resistance
high current carrying capability
extended temperature range
boosted first pass yield
enhanced production reliability
testing at full specification values
extended maintenance intervals
reduced cost of test
The MiCon Contactor brings the advantages of the Cantilever technology to Microcontroller (MCU) and Application Specific IC (ASIC) testing. MiCon fully meets the requirements of a high, stable and reliable production at lowest cost of test.
MiCon leverages the proven Cantilever technology for an architecture, which matches existing spring pin test boards and which provides the typical Cantilever self-cleaning wipe.
The extended operating range accommodates device lead trim and form variability such as device alignment accuracy and device lead coplanarity.
MiCon is a one piece contactor and ensures a long lifespan, low and stable contact resistance, high current carrying capability and an extended temperature range to test at full specification values.
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