QuadTech™
Next Generation vertical probes
- excellent mechanical characteristics
- excellent electrical characteristics
Our QuadTech™ products:
Features
- solution for 3D integration
- four internal contact points
- planar contact surface
- ultra precise manufacturing process
Benefits
- long lifespan
- long cleaning intervals
- highest test yields
- favorable probe replacement cost
Multitest Quad Tech™ applies a next-generation barrel-less architecture for vertical probes. The unique design provides a large compliance window, high bandpass and unsurpassed contact integrity.
The architecture is based on a dual-fork design that features a redundant, permanent bias.
All surfaces are open and planar and therefore have ideal plating quality.
The Quad Tech™ design is scalable to support fine pitch applications.
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programs call for paper open - abstracts due 24 May 2013 >>