Multitest MiCon® Contactor: Advantages of Cantilever Design for MCU and ASIC Testing

Significant Improvements in Overall Equipment Efficiency (OEE) Multitest recently launched the MiCon contactor. The MiCon leverages the industry-proven Cantilever technology for the final test of Microcontrollers, Industrial DSPs and Application Specific ICs. Evaluations at customer test floors showed substantial improvements in first pass yield, life span and cleaning cycles compared to spring pin solutions. MiCon fully supports the requirements of a high, stable and reliable production output at lowest cost of test. MiCon leverages the proven Cantilever technology for an architecture, which matches existing spring pin test boards and provides self-cleaning wipe. MiCon is a spring pin  footprint compatible alternative supporting advanced temperature requirements as well as advanced power/current requirements. The footprint compatibility allows for easy and cost-efficient conversion from spring pin setups. The fully decoupled load board side of the spring ensure no degradation of the load board pad. MiCon features a single piece design, which ensures a long lifespan, low and stable contact resistance, high current carrying capability and an extended temperature range. The MiCon allows for testing at full specification values. The extended operating range accommodates device lead trim and form variability such as device alignment accuracy and device lead coplanarity. Marcel Sans, Project Manager, explains: “The performance reports, received from the onsite customer evaluations, showed extraordinary advantages compared to the traditional spring pin solutions with a first pass yield of 99.8 %, time between cleaning cycles more than doubled and provided full contacting performance without signs yield degradations at high insertions counts, beyond the spring pins end of life.” To learn more about the Multitest MiCon contactor, please visit http://multitest.com/MiCon The post Multitest MiCon® Contactor: Advantages of Cantilever Design for MCU and ASIC Testing appeared first on xcerra.com.

Multitest Atlas Contactor Demonstrates Advanced Electrical and Mechanical Performance in WLCSP Testing

Atlas 0.3 mm pitch spring probe validated at customer site Multitest’s new 0.3 mm pitch Atlas contactor successfully passed a demanding customer production floor evaluation. The customer’s evaluation measures confirmed that the Atlas did reduce the customer’s cost of test while improving test yield and increasing throughput. Based on the evaluation results, the customer ordered a significant number of Atlas 030 contactors to support their new product WLCSP production ramp. The customer is a long time user of Multitest contactors and after reviewing the new Atlas design they were eager to evaluate it. It is the added strength of the Atlas cruciform tip that captured the customer’s attention.  Not only is the Atlas mechanically superior, the Atlas offers electrical performance that allows the customer to test to the true performance of the device. The evaluation ended with the customer placing an order for a significant quantity of Atlas 030 contactors. The key to the WLCSP Atlas’s high performance, high reliability and superior electrical contacting is the combination of increased mechanical tip strength and short probe electrical performance.  Atlas WLCSP test contactors achieve mechanical reliability with a rigid “cruciform” tip applied to Multitest’s QuadTech flat probe technology.  The Atlas 030 offers a short electrical path, with lower capacitance and inductance that is ideal for functional and AC parametric testing of WLCSP devices that require high system bandwidth and throughput gains in large multisite test applications. The cruciform tip provides increased tip rigidity with a much greater immunity to breakage than traditional WLCPS probes used in earlier-generation test sockets. The Atlas 030 has 0.310 mm of compliance for bump structures that requires a larger compliance window for reliable contacting in high parallel test applications. Bert Brost, Senior Product Managers, explains: “We are very proud of the positive result of the evaluation. The evaluation by the customer confirmed what we already knew, the Atlas 030 contactor is a high performance solution for WLCSP testing.” To learn more about the Multitest Atlas contactor, please visit http://multitest.com/atlas The post Multitest Atlas Contactor Demonstrates Advanced Electrical and Mechanical Performance in WLCSP Testing appeared first on xcerra.com.

Expanding Capabilities for Temperature Testing

Multitest Soak Booster for Significant Reduction of Soaking Time

Multitest recently installed the well-established tri-temp handler MT9928 with an enhanced Soak Booster option. The Soak Booster cuts down the soak time by up to 50%. Multitest is currently the only company offering this kind of advanced technology for gravity handlers.

With this development Multitest is responding to the market need for temperature testing of large devices where soak time closely correlates with throughput,  and as a result, impacts the cost of test. High-volume production test of automotive devices is one market that benefits from this enhanced Soak Booster capability.

Whereas the industry standard for gravity handling is thermal heat transfer by radiation from track to device, Soak Booster uses convection as transfer principle. The temperature controlled air is blown directly to the device.

The “Soak Booster” option is built on Multitest’s excellence in temperature test solutions and is available for SO packages down to 300 mil in size.

To learn more about the MT9928 gravity handler, please visit http://multitest.com/mt9928

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Proven RF Performance Based on Proprietary Design

Link HB Contactor Compensates for HIB Tolerances

Multitest’s Link HB contactor exhibited excellent RF performance at customer sites ensuring ultra-clean high speed signals. The patent-pending design adds boardside compliance to compensate for board fabrication tolerances ensuring increased contact reliability and multisite stability.

Based on the well-established offset vertical architecture of the Link contactor, Multitest has developed the Link HB which adds boardside compliance with improved pin/pad concentrated contact. The proprietary design of the Link HB (patent pending) compensates for load board planarity tolerances, which are particularly critical in multisite applications.

The offset vertical architecture of the Link contactor family is designed to support superior test yield, maximum repeatability and low repair and replacement cost. The wipe motion of the probe provides scrub through oxides on the IC pads and cleans itself when moving back to its original free height.

This motion is fully decoupled from the connection to the test interface board resulting in a stable connection between the probe and the load board pad, avoiding pad wear and carbon debris buildup. This implementation also eliminates the potential for arcing between the probe and the test interface board pad.

Tony Tiengtum, Product Manager, commented, “Two recent European customers have confirmed the superior performance of the Link HB contactor.  In feedback to us they said the actual performance of the contactor was as advertised and went on to say that the Link contactor technology made it seem like the sockets were essentially transparent from an electrical perspective.”

To learn more about the Multitest Link Contactor family, please visit http://multitest.com/link

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High Volume Test for Absolute Pressure Sensors

Multitest InPressure HD System Released to Production for Automotive Application

Multitest’s new InPressure HD system successfully passed all correlation tests on a customer test floor and has been released to production testing sensors for an automotive application. Multitest InPressure HD brings the field proven InPressure solution for absolute pressure test to the next level of parallel testing with up to 1440 signal lines.

InPressure HD is the next generation automotive test solution for absolute pressure sensors up to 16 bar. In addition to the increased number of signal lines, the form factor of the strip or carrier has been increased to 70 x 250 mm.

The InPressure HD supports strip-like InCarrier test. InCarrier based testing is known for low jam rates, high first pass yield and best temperature accuracy, ensuring high OEE even for challenging applications including automotive and industrial.
Short pressure setting times of below 2 seconds, as well as a parallel soaking architecture, enable the high throughput of this high volume manufacturing (HVM) test solution.

The InPressure HD continues Multitest’s modular InMEMS machine concept, which provides highest flexibility to customers by enabling different stimulus configurations for different sensor types.

Andreas Nagy, Senior Director Handler Group Marketing and Test Cell Innovation, comments: “The InPressure HD is the next generation solution for reliable HVM absolute pressure sensor test and calibration up to 16 bar, both of which are typically required in the automotive and industrial pressure sensor market. “

To learn more about the Multitest sensor test portfolio, please visit http://multitest.com/inmems/

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Best Temperature Accuracy for Testing of High Pin Count Packages

Multitest MT9510 Pick-and-Place Handler available with additional temperature control features

The Multitest MT9510 pick-and-place handler is now available with an optional active socket purge (ASP). The ASP is another feature to support the excellent temperature performance of the well-established MT9510 test handler.

By applying thermal controlled air flow to the pins the ASP keeps the temperature contact pin in the socket at the set test temperature. ASP provides optimum thermal energy to device under test and reduces the energy losses during test significantly. Particularly for high pin count devices this has a substantial influence on the overall temperature performance and therefore reduces the temperature calibration efforts.

Syariffuddin Kamarudin, Product Manager MT9510, explains: “With ASP we extend our temperature control features for the MT9510. This is especially important for the automotive market where strict requirements for temperature accuracy are in already in place. The MT9510 with ASP will support our customers to improve quality and yield.”

To learn more about the Multitest MT9510, please visit http://multitest.com/MT9510

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Multitest Atlas Contactor Brings Advanced Electrical and Mechanical Performance to WLCSP Testing

Atlas 0.3 mm pitch spring probe for reduced cost of test

Multitest’s Atlas contactor with 0.3 mm pitch responds to challenging requirements in WLSCP testing. The Atlas 030 high performance WLCPS test contactors are designed to meet the electrical requirements of today’s testing environment, without sacrificing mechanical performance. Long probe life together with improved first pass yields and easy WLCSP probe replacement in test fixtures and probe heads significantly contributes to a lower cost of test.

The Atlas 030 contact profile is critically important to achieving high bandwidth, low contact resistance, long life and high reliability. The Atlas 030 offers a shorter electrical path, lower capacitance and inductance, and increased tip rigidity with a much greater immunity to breakage than traditional WLCPS probes used in earlier-generation test sockets. The Atlas 030 has 0.310 mm of compliance for bump structures that requires a larger compliance window for reliable contacting in high parallel test applications.

The Atlas 030 contactors are designed to meet standard sizes and footprints. This makes Atlas 030 an efficient and easy to install solution for replacing other WLCSP test sockets in a variety of applications. Atlas 030 supports both manual and automated contacting of WLCSPs. The Atlas 030 combines Multitest’s proprietary precision manufacturing process for producing smooth sub-micron features with an innovative cruciform tip design for optimum electrical and mechanical performance.

Bert Brost, Product Managers, explains: “Spring probes are emerging as the wafer-level chip scale package (WLCSP) contacting technology of choice. Spring probe WLCSP contactors and probe heads provide high bandwidth, low and repeatable contact resistance, with increased compliance and are easily maintained by our customers. The Atlas 030 is our response to the need of our customers for improving mechanical and electrical performance in WLCSP testing without increasing the cost of the interface.”

To learn more about the Multitest Atlas contactor visit http://multitest.com/atlas

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Better Contacting Yield by Innovative Proprietary Design

Link HB Contactor Compensates for HIB tolerance Multitest launches a new design of the well-established Link contactor. The Link HB adds boardside compliance to compensate for board fabrication tolerances ensuring increased contact reliability and multisite stability. The offset vertical architecture of the Link probe is designed to support superior test yield, maximum repeatability and low repair and replacement cost. The wipe motion of the probe provides scrub through oxides on the IC pads and cleans itself when moving back to its original free height. This motion is fully decoupled from the connection to the test interface board resulting in a stable connection between the probe and the load board pad, avoiding pad wear and carbon debris buildup. This implementation also eliminates the potential for arching between the probe and the test interface board pad. Striving for continuous improvements to ensure best performance Multitest has developed a solution, which adds boardside compliance with improved pin/pad concentrated contact. This proprietary design of the Link HB (patent pending) compensates for load board planarity tolerances, which are particularly critical in multisite application. To learn more about the Multitest Link Contactor family, visit http://multitest.com/link The post Better Contacting Yield by Innovative Proprietary Design appeared first on xcerra.com.

Relying on Leading Test Handling Know-How: Rapid Acceptance of the New MT2168 XT Handler by the Market

Four majors IDMs decide for the MT2168 XT Multitest has received multiple orders for the new tri-temp pick and place handler, the MT2168 XT. Shortly after its official introduction to the market four global IDMs have chosen the MT2168 XT for their volume production. After comprehensive demos or onsite evaluations customers have chosen the MT2168 XT because of its temperature performance, high multisite capabilities, flexibility, and small floor space requirements. The MT2168 XT is considered a platform not only to address today’s requirements for highly reliable and cost-efficient test handling, but also because it offers great flexibility and an innovative architecture to support future needs. The highly flexible contact site layout facilitates the transfer of existing applications from legacy gravity and pick-and-place handlers, by allowing for a reuse of the existing load board. During demos and evaluations the sophisticated plunging solutions fully validated the expected best first pass yield, which directly supports high daily output in volume production. Günther Jeserer, Vice President Gravity and Pick & Place Products, comments: “Besides the discussion on the technical details, it has become obvious, how important the combination of in-depth handling know-how with advanced innovation is for our customers. A new platform needs to provide reliable quality today, but also leverage the latest technology to support highest efficiency and lowest cost. The MT2168 XT leverages both: more than 30 years expertise in test handling and a next-generation architecture.” To learn more about the MT2168 XT tri-temp pick and place handler, please visit http://multitest.com/mt2168-xt The post Relying on Leading Test Handling Know-How: Rapid Acceptance of the New MT2168 XT Handler by the Market appeared first on xcerra.com.

Expanding on Proven Solutions: New Sensor Test Module for Twin Axis Stimulation

Multitest has shipped new high g sensor test module for X/Z stimulation

Multitest shipped a new “Shaker” high g sensor test module for the MT9928. The module allows for twin axis testing in one stimulation on the x and z axis. The module expands the MEMS/sensor test portfolio for the flexible and modular MT9928 handler platform, which already includes multiple solutions for test and calibration of inertial MEMS/sensors.

With the kitable and modular MT9928 platform, in combination with dedicated MEMS/sensor test modules, the customer receives a highly flexible test setup which can easily be converted to different packages styles and MEMS/sensor applications.

The generic Multitest MEMS test approach deploys all features and functions of the standard handling system and addresses the MEMS specific requirements by adding MEMS/sensor test and calibration carts with dedicated stimulus boxes.

The new twin axis high g sensor test module is dedicated for X/Z stimulation of a MEMS device and allows for two axis testing in one stimulation. By applying one stimulation, cycle time can be saved and the packages need to be touched less often reducing the risk of damage during test. For testing at various temperature levels this advantage is even greater.

The twin axis X/Z high g module for the MT9928 gravity handler offers advantages in test time, test process optimization and flexibility, as well as, better equipment utilization. The module has proven best performance with less than 1.5 % THD at 14 g 100 Hz stimulation.

To learn more about the Multitest MEMS test and calibration solutions, please visit http://multitest.com/sensor

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Multitest Atlas Contactor Outperforms Competition:

Significant improvements in yield and life span Multitest’s Atlas contactor with the recently launched Atlas 040 probe has demonstrated substantial advantages over a competitive solution in an onsite evaluation at a major Asian customer. Both test yield and probe life span were significantly increased and contributed to a sustainable cost of test improvement  for the entire test cell. The Atlas contacting products are the next generation of Multitest’s revolutionary QuadTech flat probe technology. The Atlas 040 is a high performance contactor designed for 0.4 mm pitch WLCSP and large BGA ball count device-under-test contacting applications. The Atlas 040 was configured as part of a quad site setup with a LTX-Credence Diamond10 tester.  The Atlas 040 contactor delivered a 25% longer life for the customer with 250K insertions and first pass yields were increased by 4 percentage points. With these results the Atlas contactor clearly met the customer’s criteria to increase yields, increase system uptime, and reduce costs. After this successful evaluation the Atlas was designated the customer’s contacting solution of choice. Bert Brost, Product Managers, explains: “The development of the Atlas probe was driven by the customer’s need for a low cost probe that has the strength and reliability of a radial probe but at a fraction of the cost. The measurable focus was low cost, high bandwidth, long life, with low and repeatable contact resistance. Higher test yields and longer probe life directly translate into less test capacity required for retest, higher system uptimes and a significantly increase in the number of shipped devices.” To learn more about the Multitest Atlas contactor, please visit http://multitest.com/atlas The post Multitest Atlas Contactor Outperforms Competition: appeared first on xcerra.com.

Small Packages on Multitest Pick and Place Handlers

Multitest MT2168 and MT9510: Ready for Packages below 3 x 3 mm Multitest expanded the package range for both pick and place handler platforms – the MT9510 and MT2168 to devices smaller than 3 x 3 mm. The expanded package portfolios of the MT9510 and MT12168 go beyond the typical ranges of established pick and place systems Multitest’s industry-leading handling solutions for small sized devices fully maintain the proven temperature and multi-site test capabilities. This combination makes the Multitest pick and place handlers the platform of choice for high volume application, which not only require reliable handling of small packages with high yield, but also best accuracy and stability in the full tri-temp range. Multitest has installed multiple pick and place handling systems leveraging this new package range in Asia and Europe. To learn more about the Multitest’s pick and place handling solutions, please visit http://multitest.com/pick-place The post Small Packages on Multitest Pick and Place Handlers appeared first on xcerra.com.

Multitest Triton 080 Contactor: New Tip for Significant OEE Improvements

Multitest recently introduced a new version of the well-established high performance Triton contactor. The new TRN080 delivers reduced cleaning needs, which directly contribute to higher test cell availability and better Overall Equipment Efficiency (OEE). The Triton is the ideal high performance probe for general purpose and digital applications that demand high bandwidth contactor performance. Triton needs the requirements of the new generation of densely packaged large I/O count semiconductors for a high level of electrical and mechanical performance that is often unattainable with traditional spring probe test sockets. The next generation Triton 080 deploys a monolithic alloy probe tip that is less likely to bond with device lead/ball plating alloys. The lack of solder bonding to probe tip means reduced solder build up on probe tips leading to longer run times between cleaning. Bert Brost, Product Managers, explains: “Multitest leverages years of experience in flat probe technology and innovation in the development of spring probe components for increasing the customer′s OEE in backend test. The new Triton 080 is a perfect example how we continue to analyze the changing market requirements to offer leading products to our customers.” To learn more about the Multitest sensor test portfolio, please visit http://multitest.com/triton

Supporting Growth of Integrated Environmental Sensors

Multitest InHumid for testing of environmental combo sensors successfully installed Multitest’s first InHumid test system for final test of environmental sensors was successfully installed at a major European IDM. The Multitest solution allows for high volume single-insertion test and calibration of integrated environmental sensors measuring pressure, temperature, humidity and gas. InHumid is an optional upgrade to Multitest’s well-established InBaro module, adding humidity and gas test to the barometric test capability provided by InBaro. The physical structures to apply humid air or gas flow to the DUT reside inside the conversion kit. This architecture facilitates easy upgrading in the field. For testing the gas element of environmental sensors InHumid can be extended by a gas option. This option provides the measures needed to operate the machine in a safe manner when testing typical environmental, gases traced in air quality monitoring, or personal fitness applications (e.g. connections to attach to a general exhaust system). The InHumid solution fully leverages the temperature capabilities and proven high volume performance of the InBaro/InStrip set-up. Like with InBaro InHumid can be used in a Multitest InCarrier set up to support reliable and robust test handling of small MEMS packages, which are typical for environmental sensors in consumer applications. Gabriela Born, Director InMEMS and IoT Products, comments: “Our customers are experiencing a growing demand for environmental sensors mainly driven by expanding applications on consumer devices. In particularl gas sensors in smartphones and wearables are expected to raise the number of shipped units exponentially over the next 4 to 5 years. To meet this demand, true high-volume production solutions will be necessary, which provide reliable test at low cost per unit.” To learn more about the Multitest sensor test portfolio, please visit http://multitest.com/sensor The post Supporting Growth of Integrated Environmental Sensors appeared first on xcerra.com.

Combining Leading Temperature Performance with Highest Flexibility for Pick and Place Handling

Multitest has shipped the first MT2168 XT for ambient/hot/cold applications Multitest shipped the first MT2168 XT tri-temp pick and place handler to a major IDM. The MT2168 XT combines the innovative architecture of the MT2168 ambient/hot handler with leading temperature test performance, for which Multitest has been known for decades. The MT2168 XT offers greatest flexibility and best performance for highest return on investment and lowest cost of test. It leverages more than 30 years of experience in test handling and the technology leadership in temperature test. The MT2168 XT provides a reliable test handling solution for the complete range of packages, which are usually provided in trays, at ambient, ambient/hot and ambient/hot/cold temperature conditions. The innovative architecture and material flow offers significant advantages in throughput, stability and reliability, as well as, floor space requirements and conversion kit cost. A wide range of options allow for extending the capabilities of the MT2168 XT in the field according to actual needs. The site pitch kit supports a fully flexible contact site layout to comply with the design of existing load boards. Sophisticated plunging solutions ensure best first pass yield in high volume production. Günther Jeserer, Vice President Gravity and Pick & Place Products, comments: “Even before the public launch of this new pick and place handler, we received multiple orders from our customers, which see the unique advantage of this highly modular and scalable tri-temp handler. The MT2168 XT leverages both, the innovative design of our MT2168 platform and the more than 30 years of Multitest’s experience in test handling – particularly in temperature testing. It provides a state-of-the-art test handling solution for today’s applications and is well equipped to meet future requirements.” To learn more about the MT2168 XT tri-temp pick and place handler, please visit http://multitest.com/mt2168-xt The post Combining Leading Temperature Performance with Highest Flexibility for Pick and Place Handling appeared first on xcerra.com.

High Volume Testing of Fingerprint Sensors with Multitest InStrip

Major OSAT deploys Multitests solution for an application of one of the worlds leading fingerprint sensor companies Multitest’s InStrip has been selected to be the platform of a set up for high parallel testing of fingerprint sensors in China. The solution relies on Multitest’s well established and production proven InStrip / InCarrier, which is extended to fingerprint testing by a dedicated conversion kit (CK). The Multitest solution supports up to 90 devices tested in parallel. It is fully CK based and does not require any changes on the InStrip handler base unit. The solution leverages a special contactor design and a new concept for the cylinders, which apply the controlled and homogenous mechanical pressure on a very small area on the device under test. Andreas Bursian, Director InStrip & InMEMS Products, explains: “Fingerprint sensing technology has been considered to be one of the most reliable and cost effective biometrics technologies. Currently, we see a rapid growth in the demand for fingerprint sensors mostly driven by uses in consumer applications and smart homes but also for governmental and industrial security. The market is expecting to experience a double digit growth rate in the coming five years. This requires high volume proven test solutions. With testing up to 90 devices in parallel, Multitest offers a unique solution, which exceeds the parallel test capability of alternative (wafer probing) solution significantly.” To learn more about Multitest’s MEMS test solution for high parallel testing, please visit multitest.com/InMEMS The post High Volume Testing of Fingerprint Sensors with Multitest InStrip appeared first on xcerra.com.

Multitest Introduces ACE Contactor:

Cost-efficient contactor solution for best RF performance Multitest recently introduces the ACE Contactor, which offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages at an attractive. Typical applications for this new contactor are Power Amplifiers, RF switches and mobile communications. The ACE probe has a revolutionary, which provides exceptional electrical performance, both DC and RF. The ACE probe is manufactured from HyperCore™ base material, which is a proprietary material of Xcerra’s ECT Contact Product Group. HyerCore™ combines the mechanical properties of high carbon steel, with the electrical properties of BeCu and non-oxidizing properties of a precious metal. The materials and architecture create a very robust probe with a very working life and best yield. The electrical and mechanical performance, combined with the long probe life, deliver low overall cost of test, which are unprecedented for RF contactors. Within the range of applications the ACE probe are compatible with all device types, platings, and pitches; and all test applications, including singulated devices, strip test and wafer-scale test. The ACE contactor supports pitches down to 0.4 mm. Jason Mroczkowski, Director RF Product Development and Marketing explains: “ACE contactor has been evaluated by initial customers, which report significant improvements compared to other solutions: More than double the probe life and substantially better figures for current consumption, gain, standard deviation, and power efficiency.” To learn more about the Multitest ACE Contactor, please visit http://multitest.com/ace The post Multitest Introduces ACE Contactor: appeared first on xcerra.com.

Multitest Launches Atlas Contactor: Cost-Efficient High Performance Solution for Large I/O Count Devices in High End Digital Applications

Multitest recently launched the Atlas contactor, which has been optimized for cost-efficient and reliable testing of high end digital high ball count BGAs. Based on the well-established Multitest QuadTech flat probe technology, the Atlas contactor combines advanced mechanical and electrical probe technology for improved functionality and performance in manual test and automated test.

With an optimal insertion force and a large compliance window, the Atlas provides ultra-stable contact resistance over hundreds of thousands of device insertions. The Atlas can be configured for use without a floating alignment plate. The low Atlas per pin insertion force significantly reduces insertion strain on automated test handling systems while making the Atlas easier to use in manual test.

Atlas’ mechanical integrity includes the controlled insertion forces that are determined by the compression of a precision alloy stainless steel spring. Properties of the spring are engineered to offer predictable long-term performance over a broad temperature range: -50° to +150° C along with a typical life of 500K insertions. Atlas 040 insertion forces are controlled to just 25 grams per pin.

The insertion loss of Atlas 040 is measured at 18.5 GHz @-1dB while the return loss is measures at 14.72 GHz @ -20dB. The Atlas’ bandwidth supports the spectral content of most high speed digital device for ensuring great signal fidelity for maintaining digital edge rates. With a test height of only 3.53 mm, the Atlas 040 has the bandwidth for obtaining superb signal fidelity.

The Atlas design combines fine pitch capability with reduced contact height, force, and no damage zone contacting to meet the contacting needs of next generation for advanced high-end digital devices with typically 600 to 5,000 ball count range.

Bert Brost, Product Managers, explains: “Currently the Atlas contactor supports pitches down to 0.4 mm. Soon we will launch the Atlas for 0.3 mm pitches continuing the miniaturization and advancement of our field proven QuadTech flat probe technology

To learn more about the Multitest Atlas contactor, please visit http://multitest.com/atlas

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Expanding Application Range to Challenging SOT23 Packages

Multitests Tri-Temp Gravity Handler MT9928 supports SOT23 Devices Multitest recently shipped a high volume test handling solution for SOT23 packages. The innovative conversion kit design allows for tri-temp testing of SOT23 packages on the production proven MT9928 gravity handler. Traditionally, these packages were handled on turret handlers, but these types of handlers do not support temperature testing. With a growing number of SOT23 application, which require testing at various temperatures, this is no longer sufficient. The new Multitest kit design applies an innovative guiding principle, which is able to handle packages with missing upper body mold e.g. the SOT23 package with 4, 5 or 6 leads. With more than 1100 installations the MT9928 is well-established and provides field proven reliability and performances. Its modular and scalable design and the variety of options allow configuration of the MT9928 exactly according to the test needs. The MT9928 offers a large soak capacity and supports the entire ambient-hot-cold temperature range at outstanding accuracy and stability. To learn more about the MT9928 gravity handler, please visit http://multitest.com/mt9928 The post Expanding Application Range to Challenging SOT23 Packages appeared first on xcerra.com.

Efficient Testing of Environmental Sensors

Multitest InBaro will expand test capacity at a European IDM Multitest’s InBaro test module for barometric sensors continues to expand its footprint in the growing MEMS and sensor market. The Multitest InBaro was recently shipped on a repeat order to a major European semiconductor manufacturer expanding the capacity for testing barometric sensors. The increasing volumes associated with these types of environmental sensors are driven mainly by consumer applications such as wearables or indoor navigation. The Multitest InBaro delivers a high return on investment because it offers the greatest flexibility and supports the most cost-efficient test and calibration, which is particularly important to meet the requirements of this fast-growing market. InBaro is part of Multitest’s broad portfolio of InMEMS modules that work in combination with Multitest’s proven InStrip handler. It is designed according to Multitest’s modular concept for MEMS test and calibration, facilitating system conversion to other MEMS/sensor test applications, e.g. for gyroscope or microphone test. InBaro offers a high degree of flexibility. It can be upgraded to InHumid, which adds humidity and gas test capability to the barometric component thereby supporting highly-integrated environmental sensors. InBaro-based systems are designed to switch very fast between various pressure levels. Therefore it is possible to efficiently test and calibrate the sensors at multiple pressure levels within a single insertion, ensuring fast test times even for comprehensive test cases. The InBaro can be used in a Multitest InCarrier set up to support reliable and robust test handling of small MEMS packages, which are typical for environmental sensors in consumer applications. Garbiela Born, Director InMEMS and IoT Products, comments: “We are proud of this repeat order. It confirms that the system meets the expectations of the customer. In addition to the small package handling capability, cost-efficiency and flexibility, which all are key performance factors of the players competing in this end market, the customer particularly recognized the temperature accuracy of the system.” To learn more about the Multitest sensor test portfolio, please visit http://multitest.com/sensor The post Efficient Testing of Environmental Sensors appeared first on xcerra.com.

Ensuring Temperature Accuracy for Testing of High Pin Count Packages

Multitest MT2168 Pick-and-Place Handler offers advanced temperature control features

The Multitest MT2168 pick-and-place handler now offers an optional active socket purge (ASP). The ASP completes the portfolio of advanced temperature control features of the MT2168, which include Active Temperature Control (ATC), Cold Test for Characterization on the ambient / hot base handler version and now the ASP.

The ASP keeps the temperature contact pin in the socket on the set test temperature by applying a thermal controlled air flow to the pins. Particularly for high pin count devices this has significant influence on the overall temperature performance and reduces the temperature calibration efforts. The ASP can be configured with up to 16 independent sets of temperature sensor, controller and heater to ensure best temperature accuracy for each device under test.

Günther Jeserer, VP Gravity and Pick & Place Products, explains: “We continue to develop advanced features for the MT2168 to expand the capabilities of this leading pick and place handler. To achieve the advanced temperature performance we leveraged the more than 25 years of expertise within the Company and a wide range of production proven developments. All new features of the MT2168 will be available on the new MT2168 XT handler ambient/hot/cold test, which will be officially released later this year.”

To learn more about the Multitest MT2168, please visit http://multitest.com/mt2168

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MicroLink: Miniaturization of Link Technology for Small Pitches and Advanced Electrical Requirements

Multitest leverages the innovative and field proven Link technology to develop MicroLink – a probe which addresses advanced electrical test requirements for lower inductance and better signal integrity.

The MicroLink probe offers enhanced performance in all major electrical categories: impedance, insertion loss, inductance, contact resistance, and signal integrity. The signal path has been shortened to 0.373 mm. MicroLink supports RF applications with 60GHz and higher.

Mechanically the MicroLink probe features optimized contact wipe and pointing accuracy, which makes it most appropriate for packages with a pitch down to 0.3 mm.

Tony Tiengtum, Product Managers, confirms: “MicroLink is a field proven re-design of the well-established Link technology, which allows our customers to leverage the benefits of the Link technology for applications with even stricter electrical requirements and/or smaller device pitches. Our customers, which have been deploying MicroLink in production for several months, report that the MicroLink proves superior electrical performance over competitor’s solutions. ”

To learn more, download the MicroLink Fact Sheet: MicroLink FactSheet

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MacroLink: Making Link Technology Footprint Compatible to Existing Set-Ups

Multitest offers the field proven Link technology as a replacement option for existing solutions. MacroLink combines full foot print compatibility with production proven electrical and mechanical performance.

MacroLink particularly addresses board wear issues, which customer faced with competitor’s solutions. The MacroLink facilitates the replacement by keeping full compatibility to existing test handler conversion kits and load boards.

For MacroLink the Link probe design has been adjusted to comply with larger offset footprints. Additionally, the probe geometry has been optimized for electrical performance.

Tony Tiengtum, Product Managers, explains: “MacroLink was driven by customers request to replace competitor’s solutions, which caused substantial board wear issues. The design of MacroLink makes it an easy drop-in alternative.”

To learn more, download the MacroLink Fact Sheet: MacroLink Fact Sheet

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Link Contactor Family: Offset Vertical Probe with Wipe Design for Best Mechanical and Electrical Performance

Multitest’s Link Contactor family line for analog, mixed signal, and RF applications applies innovative vertical probe design. Link Contactors combine advantageous mechanical features – such as self-cleaning and scrub – with superior electrical performance and an architecture that eliminates wear on test interface board pads.

The offset vertical architecture of the Link probe is designed to support superior test yield, maximum repeatability and low repair and replacement cost. The wipe motion of the probe provides scrub through oxides on the IC pads and cleans itself when moving back to its original free height. This motion is fully decoupled from the connection to the test interface board resulting in a stable connection between the probe and the load board pad, avoiding pad wear and carbon debris buildup. This implementation also eliminates the potential for arching between the probe and the test interface board pad.

The footprint compatibility of the Link contactor supports easy replacement of existing solutions. The Link probe is available in different styles optimizing the solution to the requirements of the specific test applications.

To learn more about the Multitest Link Contactor family, visit www.multitest.com/Link

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Gaining A Competitive Advantage by Leveraging Xcerra Test Cell Integration

Xcerra to deliver a fully integrated and validated test cell for pressure sensor test

Xcerra provide a complete test cell to a major IDM in the automotive semiconductor market. The complete test cell solution includes the tester, handler, tester interface and the sensor test module from Xcerra, and a pressure supply unit from a third party. In addition to the hardware, Xcerra will develop the test program and provide full integration and validation services.

The Xcerra test cell will combine the high-throughput capability of the Multitest InMEMS/InCarrier solution with the cost-efficient LTX-Credence Diamondx tester. The solution will also include the integration of a third party pressure supply unit. With this Xcerra solution the customer will receive a fully integrated and validated test cell for pressure sensor calibration, trim and test, providing fast time-to-volume and optimal OEE and yield.

Andreas Nagy, Senior Director, Test Cell Innovation, comments, “With the fully integrated and validated Xcerra Test Cell the customer will benefit from high operational efficiency and an accelerated time to high volume production on day one. The high throughput solution will be able to contact 90 devices in parallel resulting in a significant cost of test advantage.”

To learn more about the Xcerra Test Cell Innovation, please visit www.Xcerra.com/TCI

 

 

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Multitest Introduces mmWave Contactor

Revolutionary interface for high frequency testing in high volume production

Multitest successfully introduced an innovative contacting solution for testing of extremely high frequency semiconductors in high volume production. The Multitest mmWave Contactor offers field proven outstanding electrical performance while maintaining best mechanical characteristics.

Multitest has developed a revolutionary hybrid contacting solution that combines traditional spring probe architecture for low frequency and power I/O’s while incorporating a cantilever solution for the peripheral high frequency transceiver I/O’s. By combining spring probe and cantilever technologies Multitest has extended the reach of volume production contactors to the extremely high frequencies ranges needed by automotive radar, WiGig, and 5G backhaul devices.

Keeping the interface from test equipment to the device as short as possible while minimizing the number of transitions is how Multitest is able to minimize the loss and maintain broadband performance from DC to 81GHz (<-10dB return loss and 4dB to 6dB insertion loss typical at 81GHz).

The mmWave contactor addresses the mechanical requirements of high volume production by incorporating high compliance, robust spring probes and materials and onsite replacement compatibility. The contactor assembly can be fully serviced onsite without incurring delays due to shipping lead times or RMA queues. The entire contacting solution is mechanically assembled and each component can be removed and replaced on site.

The mmWave contactor solution from Xcerra is a field proven solution for high volume semiconductor test that has overcome the challenge of using of metal transmission lines for extremely high frequency applications..

Jason Mroczkowski, Director RF Product Development and Marketing explains: “With the advent of production volumes of extremely high frequency semiconductors, it begs the question, ‘How will you test it?’. The experts at Multitest have considered all factors ranging from impedance discontinuities to stackup tolerances and their impact on RF performance at mmWave frequencies. Xcerra is the only supplier offering a complete test cell solution for volume production of automotive radar devices up to 81GHz. This test cell includes the tester, handler, and interface components required for a true high volume production test of mmWave devices. A critical component of this hardware is the Multitest mmWave Contactor. To date there are many lab and low volume solutions for extremely high frequency semiconductor test, but none exist for true high volume production test of mmWave devices. Until now.”

To learn more about the Multitest mmWave Contactor family, please visit www.multitest.com/mmWave

 

 

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Multitest Expands Contactor Portfolio for WLP / WLCSP Testing:

Mercury 030 combines best mechanical and electrical performance with ease of use and cost advantages  Multitest’s Mercury 030 probe meets the increasing demand for cost-efficient high performance WLP / WLCSP contacting solutions. The Mercury 030 is designed to address the electrical requirements of today’s test challenges, without sacrificing mechanical performance in an automated test environment. The Mercury 030 is a WLCSP fine pitch probe made using a Multitest proprietary process that produces a long life, high strength probe with gold plating. For high reliability, stability, and very low contact resistance contacting, the Mercury 030 has two flat surfaces moving in surface-to-surface contact. While electrical and cost benefits are turning WLP and WLCSP into the “go-to” packaging of choice, traditional wafer probe technology can prevent customers from testing the device in a WLP package to published specification. The low RLC parasitics of the Mercury 030 make it a preferred contacting solution for customers who want to fully test wafer level packaged devices in the DC, functional, and AC parametric domains. The Mercury 030 probe geometry and components provide high bandpass (8 GHz @-1 dB insertion loss) and low resistance (160 mΩ). The Mercury 030 ensures required probing coplanarity matching the vertical heights of the customers’ WLCSP balls and/or lands. With a 0.33 mm window of compliance and low insertion force, the Mercury 030 is well qualified for both singulated and multisite WLP and WLCSP contacting and/or probing. During customer field tests, the Mercury 030 demonstrated long run times between cleaning with an average probe replacement life of 300K -500K device contacts. Particularly valued in a high volume environment, the Mercury 030 is easy to setup and to maintain. Bert Brost, Product Manager at Xcerra’s Interface Product Group explains: “Although the Mercury 030 can cost less than traditional probe technology, its ease of use, ease of maintenance, and high performance attributes directly address customer test requirements. With this new contacting solution we are supporting our customers’ efforts to reduce costs and improve throughput. The Mercury 030 is the result of Multitest spring probe development experience, integrating proven technology that is of greater value to the customer than products offered by the competition.” To learn more about the Multitest Mercury family, please visit www.multitest.com/Mercury   The post Multitest Expands Contactor Portfolio for WLP / WLCSP Testing: appeared first on xcerra.com.

Most Flexible MEMS/ Sensor Test and Calibration Equipment for Best RoI

Multitest offers efficient solutions for a wide range of applications Multitest MEMS test equipment is based on a modular design, which combines well established handling equipment with state-of-the-art test and calibration modules dedicated to the specific application. This approach offers proven benefits for the test quality and the return on investment. Multitest’s portfolio includes solutions based on strip test as well solutions, which leverage the capabilities of the standard gravity or pick-and-place handling systems for up to 8 parallel test sites. All systems cover the full ambient-hot-cold temperature range. Whereas the strip test systems provide best cost of test for high volumes, smaller to medium production volumes benefit from the lower investment requirements for gravity and pick-and-place based systems. The handling systems for singulated test are combined with “MEMS” cart, which houses the exchangeable MEMS stimulus box, which is designed according to the dedicated customer requirements. This way highest flexibility is ensured: By exchanging the stimulus box the MEMS cart can be converted for different MEMS applications. By undocking the MEMS cart from the test handler, the handler is ready for standard IC test. This offers the opportunity to first calibrate the MEMS part of the device and then perform the final electrical test on the same equipment. Multitest offers a comprehensive portfolio of MEMS test solutions based on gravity and pick-and-place handlers including high g accelerometers (up to 100 g), low g or gyroscopes up to 6 degrees of freedom, magnetometer with rotating stimulus or Helmholtz coils and pressure test applications. Andy Ludwig, Product Mangers comments: “Leveraging our knowledge from handling equipment with an installed base of more than 3,500 and our experience in MEMS/sensor test and calibration equipment of more than 15 years, we are able to offer high quality solutions to our customers, which combine proven standard solutions with custom tailored modules in the most efficient way.” To learn more about Multitest MEMS and sensor test and calibration equipment for singulated devices , please visit http://multitest.com/s-mems/   The post Most Flexible MEMS/ Sensor Test and Calibration Equipment for Best RoI appeared first on xcerra.com.

Bringing MEMS Testing to the Next Level

Installation of first complete Xcerra turn key test cell for MEMS in Asia

Xcerra finalized the installation of a complete test cell for 3/6DOF inertial and navigation MEMS applications at an Asian customer. The test cell leverages proven Xcerra expertise in highly parallel test of sensor devices, delivered through the LTX-Credence and Multitest semiconductor test brands. The customer benefits from the pre-validated test cell set-up, with integrated test program and optimization support, to rapidly realize outstanding test efficiency and target yield performance.
The Xcerra MEMS test cell ideally combines the cost of test advantages of highly-parallel, high-throughput testing with the flexibility of the scalable base equipment. The Multitest InStrip handler with the exchangeable InFlipM MEMS stimulus and interface options and high-density Mercury contactors is combined with the Diamondx tester using DPIN96 digital pins; this combination supports the fast test and calibration of 3DOF magnetometers at 204 sites in parallel on strip, as well as 2/3DOF accelerometers at 216 sites in parallel, using the Multitest InCarrier solution for wafer level package test at about 1.5×1.5 mm device size. Changing between the applications requires less than 30 minutes to swap the test interfaces, the handler conversion kit and the test program.

Peter Cockburn, Senior Product Manager Test Cell Innovation, explains: “The project was driven by an Asian fabless customer, who searched for a highly parallel test solution at an OSAT to support the aggressive production ramp and cost of test reduction goals for his mobility MEMS applications. With the Xcerra Test Cell Solution, the fabless customer is now able to outsource his test in a highly efficient way. In addition, the OSAT can fully leverage the flexibility of the Xcerra Test Cell Solution for further business opportunities.”

To learn more about the Xcerra Test Cell Innovation, please visit www.Xcerra.com/TCI

 

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High Current meets Strip Test: Multitest launches HC Contactor for high parallel test

Multitest announces that its new high power Kelvin contactor for strip test successfully passed a long term evaluation for a high volume automotive application at an Asian manufacturing site of a global IDM. The outstanding yield and contactor pin lifespan enable extraordinary OEE (overall equipment efficiency) and a lower overall cost of test. The evaluation ran for over a year using a SO150 package for a high current automotive application requiring very high volumes. The results proved the outstanding performance of this contacting solution: >99% first pass yield and a contact pin life span of more than 1 million insertions. The Multitest High Current Strip Contactor addresses two critical requirements: high power carrying capability and the limited space in a high parallel test set up. Usually, strip contactors are based on vertical probe designs, which cannot meet the electrical and thermal requirements of high current applications. The new contactor is based on the established Multitest ecoAmp Cantilever design and deliveries superior electrical performance and temperature accuracy. For more information about Multitest’s ecoAmp™ contactors, visit  www.multitest.com/ecoAmp  The post High Current meets Strip Test: Multitest launches HC Contactor for high parallel test appeared first on xcerra.com.

Enabling Test for High Voltage Applications

MT9510 pick and place handler for testing up to 10 kV

Rosenheim (Germany), August 2015: Multitest has shipped the first MT9510 pick and place handler for testing high voltage applications up to 10 kV (peak). A complete solution can be provided through Multitest’s Plug & Yield program which includes a Multitest high power contactor. The entire set up has been optimized to meet the challenges of cost-efficient and reliable high voltage testing.

The Multitest high voltage solution will be deployed for the automotive market (hybrid cars) andfor consumer market applications.

The Multitest MT9510,a kitable tri-temp pick and place handler, is established as the benchmark test handler in the automotive market due to its superior temperature performance in the full ambient/hot/cold range and the broad variety of additional optional features.

The high voltage set up uses a standard MT9510 base unit. All application specific requirements are covered with the design of the dedicated high voltage conversion kit. This way the greatest flexibility at the test floor, best return on investment and lowest cost of test are achieved. With its favorable cost structure the MT9510 high voltage solution also meets the targets of more cost-sensitive applications in the consumer market.

To learn more about the Multitest MT9510, please visit www.multitest.com/MT9510

About Multitest:

Multitest (headquartered in Rosenheim, Germany) is one of the world’s leading manufacturers of semiconductor material handling equipment and interfaces for the testing and calibration of semiconductors and sensors. Multitest markets a broad portfolio of innovative and performance driven test handlers, contactors and ATE printed circuit boards. Multitest has more than 30 years of experience in the semiconductor industry, providing solutions to the automotive, consumer, communication, and sensor markets. Multitest is a company of Xcerra™ Corporation, which provides capital equipment, interface products, and services to the semiconductor, industrial, and electronics manufacturing industries. Xcerra Corporation offers a comprehensive portfolio of solutions and technologies, and a global network of strategically deployed applications and support resources. Additional information can be found at www.multitest.com and www.Xcerra.com

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Lowering Cost of Test by Reuse of Test Interfaces

Multitest’s MT9510 offers new contact site layouts

Multitest’s well-established MT9510 tri-temp pick and place handler is now available with various site pitch layouts, which are compatible with major standard handlers in the market. The new site pitch layouts enable to customer to re-use existing loadboards from other handling equipment for applications on the MT9510.

The Multitest MT9510 is a kitable tri-temp pick and place handler, which is known for its superior temperature performance and a wide range of options to address specific customer requirements. With an installed base of more than 800 the MT9510 platform is highly accepted in Asia, Europe and USA. The site pitch compatibility now allows for easy and economic transfer of applications form other handling equipment to this highly reliable system by reusing the existing test interface boards.

The MT9510 platform supports parallel test of up to 8 devices (MT9510 XP) or up to 16 devices (MT9510 x16) with up to 4 (MT9510 XP) or 8 (MT9510 x16) horizontal sites. The new site pitch layout for quad setups allows for horizontal site pitches from 40mm up to 80 mm and vertical site pitches from 60 mm up to 63.5 mm. The new site pitch layouts require only a minor modification of the handler base and therefore are backward compatible to a standard MT9510 site pitch.

Syariffuddin A.Kamarudin, Product Manager for the MT9510 platfrom adds: “The new site pitch layout option not only allows an easy transfer of standard applications from other pick and place handler brands, but also make the MT9510 compatible for the Multitest MEMS modules, which have been developed for the Multitest gravity feed product line. Beyond the direct reuse of existing test interface boards, we see our customer leveraging the loadboard compatibility at their engineering sites, where they now can use the exact same board design for package characterization, as it will be used later in volume production”.

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Expanding MEMS Test and Calibration Portfolio for Pick & Place Handlers

Multitest launches magnetic (MRS) sensor test module for MT9510

Multitest adds a magnetic rotation stimulus (MRS) module for sensor test on the MT9510 handler to the MEMS/sensor test product line. The module allows for x and y axis testing of magnetic sensors on a flexible and well-established pick and place handler platform. The MRS module, which was originally available for only the MT9928, now also supports test and calibration of sensors in packages which are typically handled on pick and place handlers.

The Multitest MT9510 is a kitable tri-temp pick and place handler, which is known for its superior temperature performance and a wide range of options to address specific customer requirements. Typical packages include BGA, CSP, LGA, Micro-BGA, MLP/MLF, PLCC, PGA, QFN, and TSSOP.

The generic Multitest MEMS test approach deploys all features and functions of the standard handling system and meets the MEMS specific requirements by adding MEMS/sensor test and calibration carts with dedicated stimulus boxes. The new MRS sensor test solution for pick and place handlers continues this aApproach.

The new MRS module for the MT9510 pick and place handler allows for leveraging the proven MRS sensor test solution for a new range of packages.

To learn more about Multitest’s MEMS test and calibration solutions, please visit www.multitest.com/sensor

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One Insertion for Testing at Multiple Set Temperatures

Multitest MT2168 Pick-and-Place Handler offers multi-temperature testing within one plunger cycle

The Multitest MT2168 pick-and-place handler now offers multi-temperature test with only one insertion. The highly dynamic temperature control allows for testing at multiple set temperatures within one plunger cycle. This new feature particularly addresses the requirements in design and engineering sites.

The fast and accurate changes of the set temperatures are based on the chamberless soaking solution in the contact unit of the MT2168. This design allows for exact thermal measurements and prompt temperatures adjustments for each device under test.

Multi-temperature testing with only one insertion significantly reduces the operator actions and the stress on the device under test. It is an ideal solution for temperature characterization at engineering sites, because it fully supports lights-out operations over nights or at weekends.

The MT2168 can also be configured to meet the speed and automation requirements of high volume production. This allows for the same platform that was deployed in engineering and test development to also be used in volume production.

To learn more about the Multitest MT2168, please visit www.multitest.com/MT2168 .

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Conversion Kit Design Makes a Difference

Multitest launches local kit design team in the Philippines

Multitest makes a significant step to expand customer support. Starting May 2015 an additional design team for conversion kits will be supporting the needs of Asian customers. The local design team based in the Philippines will be the expert contact for kit related requests of customers and ensure shortest response times.

Efficient handling solutions are often based on appropriate design of the conversion kits. Customers will be able to explain their requirements directly to the designers and  will receive immediate feedback on the available design options. Understanding the conditions of each alternative provides a better basis for decision making.

Based in the close location to the customer the design kit team will be able to get clarification on open issues fast and efficiently. The overall cycle time from kit order to delivery can be substantially shortened.

Syariffuddin A. Kamarudin, Product Manager, explains: “Kit business is important for our customers and for us. Often the overall handling solution is based on innovative kit design. We are proud to offer this additional support to our customer base in Asia. We staffed the team with experienced designers. Our goal is to establish another channel for technical discussion with our customers. The designers will work with customers onsite. A thorough understanding of the customer requirements will enable them to translate it directly into a design concept.”

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Combining Flexibility and Throughput Improvements for Sensor Test

Multitest has shipped first 45° high g sensor test module for kitable MT9928 gravity handler

Multitest shipped the first “Shaker” 45° high g sensor test module for the MT9928 to a major international IDM. The module allows for a two axis testing with one single stimulation on a flexible and modular handler platform. The well-established “Shaker” module, which was originally available for the MT93xx only, is now also available for the flexible and modular MT9928 gravity handler. The MT9928 has a kitable and modular architecture and therefore can be converted to different package types and configured with various loading and unloading options. The generic Multitest MEMS test approach deploys all features and functions of the standard handling system and meets the MEMS specific requirements by adding MEMS/sensor test and calibration carts with dedicated stimulus boxes. The new 45° high g sensor test solution fully continues this approach. The 45° high g sensor is dedicated for X/Y stimulation of the MEMS devices and allows for two axis testing in one single stimulation. This way one stimulation cycle time can be saved and the packages need to be touched less often, which reduces the risk of damages during test. If testing has to be done at various temperature levels this advantage multiplies. The new 45° high g module for the MT9928 gravity handler combines test time and test process optimization with more flexibility and better equipment utilization. To learn more about Multitest’s MEMS test and calibration solutions, please visit www.multitest.com/sensor The post Combining Flexibility and Throughput Improvements for Sensor Test appeared first on xcerra.com.

Offset Vertical Probe with Scrub Design for Best Test Yield and Lowest Cost of Test

Multitest Adds Link Contactor to Its Interface Products Portfolio

Multitest has launched the new Link Contactor product line for analog, mixed signal, and RF applications. The innovative vertical probe design combines advantageous mechanical features – such as self-cleaning and scrub – with superior electrical performance and an architecture that eliminates wear on test interface board pads. The Link contactor is based on the technology developed by Titan Semiconductor Tools acquired by Xcerra Corporation in February.

The offset vertical architecture of the Link probe is designed to support superior test yield, maximum repeatability and low repair and replacement cost. The motion of the probe provides scrub through oxides on the IC pads and cleans itself when moving back to its original free height. This motion is fully decoupled from the connection to the test interface board resulting in a stable connection between the probe and the load board pads, avoiding pad wear and carbon debris buildup. This implementation also eliminates the potential for arcing between the probe and the test interface board pad.

The Link probe offers a bandwidth of 60 GHz @ -1 dB. The short signal path minimizes distortion and makes testing with a Link comparable to solder board device testing.

The footprint compatibility of the Link contactor supports easy replacement of existing solutions. The Link probe is available in three different styles – Link HD, Link EC and MicroLink – optimizing the solution to the requirements of the specific test applications.

Tim McNulty, Vice President of the Xcerra Interface Products Group comments: “Titan Semiconductor Tools has developed a unique contactor technology that fits in perfectly with our overall strategy of offering customers best-in-class testers, handlers, interface boards and contactors, as well as, combining those products into total test cell solutions. The Link technology overcomes the mechanical, wear and maintenance issues associated with competitive solutions for the target market of high speed applications.”

Learn more about Link Contactor

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Multitest Adds Link Contactors to Its Interface Products Portfolio

Offset Vertical Probe with Scrub Design for Best Yield and Lowest Cost of Test

Multitest has launched the new Link Contactor product line for analog, mixed signal, and RF applications. The innovative vertical probe design combines advantageous mechanical features – such as self-cleaning and scrub – with superior electrical performance and an architecture that eliminates wear on test interface board pads. The Link contactor is based on the technology developed by Titan Semiconductor Tools acquired by Xcerra Corporation in February.

The offset vertical architecture of the Link probe is designed to support superior test yield, maximum repeatability and low repair and replacement cost. The motion of the probe provides scrub through oxides on the IC pads and cleans itself when moving back to its original free height. This motion is fully decoupled from the connection to the test interface board resulting in a stable connection between the probe and the load board pad, avoiding pad wear and carbon debris buildup. This implementation also eliminates the potential for arching between the probe and the test interface board pad.

The Link probe offers a bandwidth of 60 GHz @ -1 dB. The short signal path minimizes distortion and makes testing with a Link comparable to solder board device testing.

The footprint compatibility of the Link contactor supports easy replacement of existing solutions. The Link probe is available in three different styles – Link HD, Link EC and MicroLink – optimizing the solution to the requirements of the specific test applications.

Tim McNulty, Vice President of the Xcerra Interface Product Group comments: “Titan Semiconductor Tools has developed a unique contactor technology that fits in perfectly with our overall strategy of offering customers best-in-class testers, handlers, interface boards and contactors, as well as, combining those products into total test cell solutions. The Link technology overcomes the mechanical, wear and maintenance issues associated with competitive solutions for the target market of high speed applications.”

Learn more about Link Contactor

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InCarrier plus Dedicated to High Volume Production

Multitest launches the next generation loader for test in carriers

Multitest is launching the first InCarrierplus with the shipment to a major IDM with high volume production in Europe and Asia. The InCarrierplus is the new state-of-the art loading solution for test in carriers. It is designed to optimize the back-end process at high volume production sites. The InCarrierplus supports the device loading to carrier from standard back-end transport media in a most cost-efficient and productivity-oriented way.

Since Multitest introduced the InCarrier concept to leverage the advantages of strip handling for singulated packages, this process has been well-accepted in the market. Up to now more than 3 billion packages were tested on InCarrier set-ups. The customers fully benefit from the robust, high parallel test solution. The advantages are particularly recognized for large production lots, long test times and/or small packages.

The InCarrierplus is minimizing cost of loading and increases throughput  up to 16,000 units per hour depending on packages sizes. The InCarrierplus has been optimized for smaller footprint and requires less space on the test floor. The InCarrierplus is supporting standard back-end transport media – such as JEDEC trays and bulk – and can be smoothly integrated in state-of-the-art production flows and lines. On the test floor the InCarrierplus / InStrip solution can be combined with standard final packaging equipment for tape & reel, tube or tray output and fits therefore seamless into the production process.

Andreas Nagy, Senior Director Marketing commented: “Multitest was the first supplier to who actually offered the test in carrier solution – the first Multitest InCarrier Loader/Unloader was launched as a dedicated loading and unloading tool. The InCarrierplus leads this concept to the next level of overall productivity improvement. This gets achieved by significant loading cost reduction at the InCarrierplus and the elimination of the unloading cost by direct un-load into tape & reel at traditional final packaging equipment for high volume production”

Learn more about InCarrierplus

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InCarrier Loader plus Dedicated to High Volume Production

Multitest launches the next generation loader for test in carriers
Multitest is launching the first InCarrier Loader plus with the shipment to a major IDM with high volume production in Europe and Asia. The InCarrier Loader plus is the new state-of-the art loading solution for test in carriers. It is designed to optimize the back-end process at high volume production sites. The InCarrier Loader plus supports device loading to carrier from standard back-end transport media in a most cost-efficient and productivity-oriented way. Since Multitest introduced the InCarrier concept to leverage the advantages of strip handling for singulated packages, this process has been well-accepted in the market. Up to now more than 3 billion packages were tested on InCarrier set-ups. The customers fully benefit from the robust, high parallel test solution. The advantages are particularly recognized for large production lots, long test times and/or small packages. The InCarrier Loader plus is minimizing cost of loading and increases throughput up to 16,000 units per hour depending on packages sizes. The InCarrier Loader plus has been optimized for smaller footprint and requires less space on the test floor. The InCarrier Loader plus is supporting standard back-end transport media – such as JEDEC trays and bulk – and can be smoothly integrated in state-of-the-art production flows and lines. On the test floor the InCarrier Loader plus / InStrip solution can be combined with standard final packaging equipment for tape & real, tube or tray output and fits therefore seamless into the production process. Andreas Nagy, Senior Director Marketing commented: “Multitest was the first supplier who actually offered the test in carrier solution – the first Multitest InCarrier Loader / Unloader was launched as a dedicated loading and unloading tool. The InCarrier Loader plus leads this concept to the next level of overall productivity improvement. This gets achieved by significant loading cost reduction at the InCarrier Loader plus and the elimination of the additional unloading steps, because the trays with the tested devices will be processed directly by traditional final packaging equipment for high volume production.” Learn more about InCarrier Loader plus The post InCarrier Loader plus Dedicated to High Volume Production appeared first on xcerra.com.

High Volume Test and Calibration of Barometric Sensors

Multitest InBaro confirmed as platform of choice

Multitest successfully introduced a new solution to their MEMS test and calibration portfolio: Multitest InBaro for high parallel test of barometric sensors. During a benchmark evaluation at a major European semiconductor manufacturer the InBaro specification outperformed the competition and was selected as the standard platform for test and calibration of their barometric sensor devices for consumer applications.

The InBaro provides a reliable multisite test and calibration solution for barometric pressure sensors and gas detection sensors for e.g. 144 and more devices in parallel with a maximum signal count of 2400 pins per insertion. It enables temperature test at a range form – 40°C up to +125°C with best temperature accuracy and stability. The InBaro standard configuration supports quick exchange between five pressure levels – more can be added on request. InBaro features absolute pressures up to 1,500 mbar. The InBaro can be upgraded to “InHumid” to expand the application to other environmental sensor devices.

As an addition to the Multitest InMEMS portfolio the InBaro continues the modular concept, which allows for highest flexibility and reuse of equipment. Based on the InStrip handler, which can process packages in strips or carriers, all InMEMS modules fully leverage the highly stable package handling and ease-of-operation to ensure production proven high throughput and overall equipment efficiency (OEE).

Andreas Bursian, Product Manager, comments: “With InBaro our focus is to provide a solution for high volume production of barometric pressure sensors. We understand the urgency in consumer application field for best productivity and return on investment to meet the volume and cost targets. The customer appreciates the production proven modular concept of InMEMS, which convinces with the ease of operation and low maintenance requirements. Based on the InMEMS architecture the InBaro set-up can be easily converted for other MEMS test applications. The ability to upgrade the InBaro to InHumid is in line with the anticipated developments in the consumer applications area.”

Multitest offers a variety of solutions for test and calibration of pressure sensors in strips or singulated. The portfolio ensures that the actual test requirements in terms of pressure level, package type and production volume will be matched.

Learn more about Multitest MEMS and sensor test and calibration

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Cost-efficient and Flexible Solution for Managing Power Dissipation

Multitest ATC for the MT2168 Pick-and-Place Handler

The Multitest ATC option for the MT2168 pick-and-place handler offers a most cost-efficient and flexible solution for managing low to medium range power dissipation at multisite test cells with up to 16 sites. Multitest ATC is an easy add-on to the standard MT2168, which can be mounted and demounted effortless. Multitest ATC is an affordable, reliable and flexible solution for test development and high volume production.

In the past power dissipation was recognized as an issue for high performance server, processor and graphic applications. Today package density and integration increases more and more to achieve higher speed and save space particularly in mobile applications. The power dissipation here is significantly less than in the high performance applications. However, thermal stress may damage the packages, temperature test may be distorted and test repeatability and yield lost. Additionally, there is a higher cost pressure for this market, which requires best cost of test configurations.

Multitest meets this need for managing power dissipation with the ATC add-on to the MT2168. No dedicated equipment is required, but all ATC functions are delivered by parts of the conversion kit. The operation is unchanged to a standard set-up and no dedicated training or spare part management is needed.

The Multitest ATC ensures highest flexibility. It can easily be mounted, demounted and changed to other MT2168 handlers in the field. Any standard MT2168 can be configured with this add-on, but will be available for standard test again once the add-on will be removed.

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Multitest’s MEMS and Sensor Test and Calibration Portfolio Supports the Increasing Functionalities of Mobile Phones

Multitest meets performance and cost requirements of today‘s mobile applications

The Multitest has been providing MEMS and sensor test and calibration equipment for more than ten years. Originally driven by the automotive market Multitest continuously expanded the product offering to meet the needs of consumer and mobility applications. Today Multitest provides solutions for accelerometers, gyroscopes, pressure and gas sensors, humidity sensors, magnetometers, microphones, optical sensors and oscillators. The set-ups cover test of singulated packages, high-parallel testing up to multi-DOF test.

The features and functionalities of smartphones significantly grew. Portrait/landscape switching, pedometers, gaming, navigation have been complemented by location-based services, 3D gaming, advanced user interfaces, high-resolutions camera stabilization, and authentication. Barometric features, indoor navigation and activity monitoring have been the latest enhancements. Analyzing the bill of materials of the recently launched smartphones gives some insight, which types of sensors are deployed to enable this: accelerometers, gyroscopes, proximity, compass and barometers. In the more advanced phones gesture and heart rate sensors are integrated.

Andreas Nagy, Senior Director Marketing Handler & TCI comments: “Based on our experience and the comprehensive portfolio we are able to fully cover the technical requirements. Moreover, our equipment concept addresses the also business challenges in this fast moving and volatile market: high volumes, fast ramping, and substantial cost pressure. Our solutions are modular, flexible and re-configurable and support high parallel test of both – strips and singulated packages. For combo sensors multi-stimuli solutions up to 9 DOF are available. Within the Xcerra group we are able to deliver a turnkey MEMS/sensor test call including testing (ATE), MEMS/sensor actuation and package handling. This way our customers are able to combine the advantages of a complete solutions with the substantial benefits from a modular concept.”

Learn more about Multitest MEMS and sensor test and calibration

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MT2168: Package Characterization at Cold Conditions

Leveraging the benchmark for ambient/hot test for tri-temp qualification

The Multitest MT2168 pick and place handler now offers the ability to characterize devices at cold conditions. This addresses the evolving requirements for temperature performance driven by applications in the end markets. Whereas final test of the respective devices in high volume production will only be done at ambient/hot, they need to get qualified for cold conditions before they ramp. The “Cold for Characterization” option of the MT2168 allows for using the one platform for qualification and final test without the need to invest in more complex and more expensive tri-temp test equipment.

The “Cold for Characterization” set-up of the MT2168 is an add-on to the standard base unit, which does not require changes in the handler itself. All required features are part of the conversion kit set. The customer can decide, whether he wants to use existing external chillers or if he prefers to have a LN2-based heat exchanger integrated. The “Cold for Characterization” option provides temperature conditioning directly at the contact site and sticks to the chamberless concept of the MT2168. This way no icing issues or defrost needs occur.

Günther Jeserer, Vice President for Gravity and Pick & Place Handling explains: “The MT2168 ‘Cold for Characterization’ meets the needs of the qualification teams at our customers: They can rely on the ease-of-operation of ambient/hot system but can do their full temperature characterization. With changing temperature performance requirements in the consumer markets and new car convenience and car entertainment applications in the automotive market, we anticipate a shift from strict tri-temp test in volume production to cold qualification before ramping. The MT2168 is the only handler with this ability, which is well received by our customers.”

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Cost-efficient Fine Pitch Load Boards Meet Market Needs

Multitest PCBs are leading the way for 0.3 mm pitch array applications
Multitest has again increased its lead over the competition for fine pitch load boards. Advancements in proprietary plating processes along with new technology in drilling and registration techniques ensure reliability, short cycle times and low cost. Multitest has responded to the needs of its customers in the very price sensitive mobile applications and vertical probe cards markets. Fine pitch printed circuit boards are still a challenge in ATE board the industry, but Multitest leverages its expertise in single lamination high aspect PCBs to support the demands of fine pitch BGA and WLCSP applications. Based on many years of experience building high aspect ratios, Multitest deploys state-of-the-art equipment in a stable process to use mechanical drilling for 0.3mm & 0.35mm pitch via in pad constructions. PCBs with 40+ layers at .35 mm can be manufactured in a single lamination process without the use of laser drilled, “stacked”, blind vias. Christopher Cuda, Product Manager, comments: “Using our established and continuously refined fabrication processes for 0.3 & 0.35mm geometries enables us to meet today’s requirements at reasonable cost and with the reliability customers have come to expect from Multitest.” The post Cost-efficient Fine Pitch Load Boards Meet Market Needs appeared first on xcerra.com.

Strip Test for Automotive Applications

European IDM selected Multitest InStrip for high parallel test in automotive production

Multitest InStrip® test handler has been already well-established at a number of different customers in Asia, Europe and US. Recently, Multitest received a multiple order from European IDM that will leverage the high-parallel test capability for standard SOCs for the automotive market.

In the past strip test was considered not be appropriate for applications with high quality requirements – such as automotive or medical – because singulation of the packages would have to take place after testing. Multitest‘s InCarrier concept overcomes these issues and combines the substantial advantages of the strip handling process with the quality driven advantages of the standard test handling process. “Although the automotive market is driven by high quality requirements, reduced cost of test will give our customers a competitive advantage. High parallel strip test will substantially increase their test efficiency”, explains Peter Killermann, product manager.

The Multitest InStrip is known for production proven performance in tri-temp strip test of standard ICs and MEMS. Leading contacting technology, outstanding temperature performance, ease of use as well as greatest flexibility make the InStrip® the optimal solution for high volume final test. Advanced device tracking features as well as factory automation options like recipe management and remote system control support the high quality demands of the automotive users.

“High temperature performance and tri-temp capability is a standard requirement in the automotive market segment. The Multitest InStrip particularly convinced with the proven temperature accuracy and stability for the entire carrier”, concludes Killermann.

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