Contactor Related Cost of Test:
cleaning cycles and life span are key
- effects on overall test cell
- effect on test yield
The actual cost of test directly influenced by the contactor is much higher than the purchase price for the contactor and the spare pins.
Life span and cleaning cycles have an immediate effect on the overall test cell availability. Maintenance and replacement will cause test cell downtimes that are even more significant when cold testing is done. Complex replacement processes will extend the downtime further.
It is crucial that the test cell is utilized as much as possible to ensure a reasonable return on investment (ROI). Furthermore, re-test of already tested, but failed devices reduces the ROI of the test cell.
The same is true for actual production loss due to incorrectly rejected devices. They have occupied the test cell; however they will not bring Revenue.
Also, it is important to consider that the first-pass yield will decline before a pin finally needs to be replaced.
Additionally, for all cleaning and maintenance the cost of labor should be considered.