combines the advantages of the singulated device test with the advantages of strip test
loading into strip-like device carriers with Multitest loading equipment
supports standard transportation media of the backend process
leverages Multitest InStrip for singulated packages
offers all features of the standard InStrip set-up
unloading into final packaging media
robust handling for even smallest devices
high parallel test
flexible line set-up for loading, test and unloading
supports WL test and burn-in test
re-test option for single devices in the same equipment
Handling Solutions for
leaded and leadless devices
large and even smallest package sizes down to 1 x 1 mm
MEMS calibration test
Multitest InCarrier process is based on a strip-like device carrier for single devices that combines the advantages of the singulated device test with the advantages of high parallel strip test.
The InCarrier material flow at the test floor remains over all similar to the established standard process. Unlike to strip test, the InCarrier test requires no singulation after test. Therefore the final test remains true final test. This way it overcomes the boundaries of strip test and meets the automotive 6 sigma – 0 PPM requirements.
Leveraging the strip like design the InCarrier ensures robust test-handling for even smallest devices and supports high parallel test.
The InCarrier loading supports all standard transportation media of the backend process:
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