The InMEMS concept combines dedicated MEMS modules with the Multitest InStrip®. This expands the advantages of strip test to MEMS: high parallel test and stable device handling for small packages.
Multitest InCarrier® also leverages these benefits for singulated devices. The single packages are placed into a tray – the so called InCarrier® – and then handled in the Multitest InStrip®.
Further applications on request.
Please contact info.Multitest@Xcerra.com