Do not miss our expert presentations at BiTS
Kelvin Contactors for Wafer-Scale Test
Date: Monday March 10, 2014
Session 2: Doing the Heavy Lifting
Time: 3:30 – 5:30 p.m.
Speaker: Jim Brandes
Abstract: As more functionality is included in integrated circuits, there is an increasing need to make extremely accurate voltage measurements or force extremely accurate voltages to perform tests such as RDSON and VDO. The only way that these environment, over hundreds of thousands of insertions, is to contact the device through a Kelvin connection.
The challenge of wafer-scale test is performing final test, with its high currents, accurate measurement requirements and full-speed functional, at the wafer level. This requires a high-performance contact method that fits into the wafer-probe environment. If Kelvin contact is required, the challenge is dramatically increased.