Join Xcerra at Semicon West
President and CEO, Dave Tacelli, will join the panel discussion “Testing into the Future” which will be part of the TechXpot North session “Seeking Growth” on Tuesday, July 8, 2014 from 10:30 am – 12:30 pm hosted by Collaborative Alliance for Semiconductor Test (CAST). Dr. Reinhart Richter, CTO of Xcerra Corporation, will present at Test Vision 2020 conference. The presentation will be held in the “loT Related Subjects” session on Thursday, July 10 from 3:00 to 4:15 pm.
The CAST TechXpot “Testing into the Future” will start with updates on the ITRS and CAST activities. The historical barriers between Fab, Assembly and Test are breaking down as new technologies are adopted. The ITRS Test Roadmap identifies these technologies and CAST activities are directed towards pre-competitive solutions to enable them. The presentations will lead into the panel session that will discuss the business implications and opportunities.
At the Test Vision 2020 conference Dr. Richter will focus how the new sensors devices that are required to support the loT can be tested and calibrated efficiently. Sensor test typically includes providing a defined stimulus signal while the device is being tested not only to validate the device function but also to calibrate its output signals.
In the presentation Dr. Richter will discuss application areas and limits of “classical” gravity, pick & place or turret sensor handling with a stimulus box and their economics. The alternatives include sensor calibration by electrical stimulus, wafer level stimulus; strip testing and carrier based testing. Pro´s and con´s will be reviewed in detail. Dr. Richter will also review challenges of upcoming sensor fusion into single packages (“combos”) and the integration with radios and uControllers as driven by the loT.