Strip Test for Automotive Applications
European IDM selects Multitest InStrip for high parallel test in automotive production
Multitest InStrip test handler has been already well-established at a number of different customers in Asia, Europe and US. Recently, Multitest received a multiple order from a European IDM that will leverage the high-parallel test capability for standard SOCs for the automotive market.
In the past strip test was considered not to be appropriate for applications with high quality requirements – such as automotive or medical – because singulation of the packages would have to take place after testing. Multitest‘s InCarrier concept overcomes these issues and combines the substantial advantages of the strip handling process with the quality driven advantages of the standard test handling process. “Although the automotive market is driven by high quality requirements, reduced cost of test will give our customers a competitive advantage. High parallel strip test will substantially increase their test efficiency”, explains Peter Killermann, product manager.
The Multitest InStrip is known for production proven performance in tri-temp strip test of standard ICs and MEMS. Leading contacting technology, outstanding temperature performance, ease of use as well as greatest flexibility make the InStrip the optimal solution for high volume final test. Advanced device tracking features as well as factory automation options like recipe management and remote system control support the high quality demands of the automotive users.
“High temperature performance and tri-temp capability is a standard requirement in the automotive market segment. The Multitest InStrip particularly convinced with the proven temperature accuracy and stability for the entire carrier”, concludes Killermann.