True Kelvin Test for WLCSPs
Multitest to launch new fine pitch probe for Gemini Kelvin family
Multitest has designed and characterized a Kelvin probe that is targeted at WLCSP. Today many of the devices that are packaged at the wafer level require parametric tests that are sensitive to contact resistance. The new Multitest GMK30 probe enables Kelvin contacting at 0.3 mm pitch in-line and at 0.4 mm pitch for arrays.
The GMK30 probe allows for true Kelvin connections to critical DUT contact points and will ensure accurate voltage measurement and accurate voltage application regardless of the contact resistance. The GMK30 probe is designed primarily for WLSCPs but is also appropriate for QFNs and other packages.
Multitest leverages the industry proven expertise in Kelvin test and WL test for this new contacting solution. Multitest has a highly reliable manufacturing process to produce these small asymmetric probes with extremely accurate and repeatable features.
The GMK30 is targeted at high volume production and ensures a longer useful life, better reliability and higher yield. A beta site test showed a first-pass yield improvement of more than 10 percent. To support an easy transition from engineering to volume production, manual actuators and manual alignment frames make the GMK30 applicable for low volume engineering set ups.