Xcerra at Semicon Europa
Grenoble, France, October 7 to 9
Join us at the 16th European Manufacturing and Test Conference (EMTC)
Date: Wednesday, October 8, 2014
Time: 1:50 – 2:10 pm
“Using a Test-Cell Solution Approach to Achieve Device Quality and Production-Efficiency Goals for 77GHz Automotive Radar ICs”
Speaker: Peter Cockburn, Senior Product Manager – Test Cell Innovation
Acknowledgment: This paper has been jointly developed with Mauro Strazzeri of STMicroelectronics
Legislation to reduce car injuries is causing dramatic growth in ADAS (Advanced Driver Assistance Systems). Radar-based ADAS are moving from 24GHz to 77GHz, providing better range, bandwidth and resolution for detecting objects. Automotive 0 ppm failure rates necessitate full functional test of the ADAS ICs at 24GHz or 77 GHz in both Engineering and HVM.
Specialized ATE solution may be under-utilized as requirements change are not well adapted for HVM. An ideal solution should be usable with different RF and Automotive applications.
A co-development between ST and Xcerra has already implemented 25GHz RF test to maintain the highest quality levels. This is based on a flexible test call base that can be used for other requirements and a system-level solution to maximize OEE and minimize cost. The test cell is now being extended to provide a 77GHz test solution.