solution for 3D integration and mobile applications
four internal contact points
low force requirements
highly accurate probe positioning
best dimensional stability and coplanarity
ultra precise manufacturing process
long cleaning intervals
highest test yields
favorable probe replacement cost
Multitest Quad Tech™ applies a next-generation barrel-less architecture for vertical probes. The unique design provides a large compliance window, high bandpass and unsurpassed contact integrity.
The architecture is based on a dual-fork design that features a redundant, permanent bias.
All surfaces are open and planar and therefore have ideal plating quality.
The Quad Tech™ design is scalable to support fine pitch applications.
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