Special contactor requirements for Wafer-Level Test
high compliance probes to accommodate for device non-planarity
contacting force needs to be high enough to pierce oxides and debris on the DUT
reliable electrical performance
Wafer-level test is complete final test at wafer-level. The electrical requirements are identical to final test – only the handling of the device is different. Instead of a test handler a wafer prober is used.
The contact at wafer-level test is made to solder balls, just as in final test. Wafer-level devices are not as planar and clean as wafers themselves. The contactors need features to cope with that.
Wafer-level packaging is cost driven. Therefore the contactors for wafer-level test also need to be cost-effective and offer low cost of ownership.
The Multitest Quad Tech™ contactors offer a comprehensive variety of technologies for wafer-level test. The wafer-level test contactor can be chosen from this range with respect to the electrical requirements.
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